Scanning Electron Microscopy (SEM)
FE-SEM profile, multiple indicator, representative of FOV
Microimage, Cross-section sample, Reconstruct 3D, Crystal particle orientation and shape statistics.
FE-SEM profile, multiple indicator, representative of FOV
TEM/HRTEM chart, crystal stripes, size statistics; Based on regular TEM/HRTEM integrated project 500 yuan/sample reference.
TEM/HRTEM chart, crystal stripes, size statistics; Based on TEM/HRTEM integrated project 500 yuan/sample.
FE-SEM profile, multiple indicator, representative of FOV
Cross-section, layer thick, three-dimensional reconstruction of data
Crystal particles, orientation, polar maps, fabric distribution
10-80X solid/powder/block observation
Open/dark/light observation
Three-dimensional shape, Roughness, contour
3D deep image and face image
Crystal particles, direction, fabric
Organization dyed
Cell fluorescent imaging
Division bag the slices.
Volume, Table area, Peak Rate, Reconstruct 3D
Hole/cleavage/internal structure
AI / SimulationAI projects, DFT, MD, AIMD, data analysis, and software development
Characterization / SuppliesCharacterization, supplies and instruments, contracts, invoices, shipping, and after-sales support

Applicable to AI project, DFT, MD, AIMD, data analysis, scientific mapping and software development needs. For addition, please comment on "OfficeNet Consulting + Unit + Demand Keywords".

For characterization, laboratory supplies and instruments, contracts, payments, invoices, shipping, and after-sales support.