XPS Survey Spectrum
Survey, core energy level alignment, price analysis; Comprehensive project based on XPS spectral + fine spectrometry; Only Survey is allowed a different price..
XPS, UPS, AFM, TOF-SIMS, contact angle and interface status analysis.
Survey, core energy level alignment, price analysis; Comprehensive project based on XPS spectral + fine spectrometry; Only Survey is allowed a different price..
Survey, core energy level alignment, price analysis
UPS spectra, Work Function, price band structure
Qualification of surface elements/semi-quantitative, micro-area composition analysis; Depth Parsing Optional
Ion fragments, Deep Curve, Two-dimensional imaging
Deep Parsing Curves, Different Depth Prices; XPS depth profile reference; ToF-SIMS Depth Profiling reference price 3500 Yen/sample.
AFM, Rq/Ra, cross-section height
Ion fragments, Deep Curve, Two-dimensional imaging
Water/oil exposure angles, rolling angles, surface free energy (optional)
Surface Tension, interface tension and time change curve
Reflexrate Curve, Proposed Parameters
Oxygen/air/nitrogen/thylene
Combining kinetic tests
Molecular dynamics
TPD/TPR/TPO curve, peak area, active site explanation
AI / SimulationAI projects, DFT, MD, AIMD, data analysis, and software development
Characterization / SuppliesCharacterization, supplies and instruments, contracts, invoices, shipping, and after-sales support

Applicable to AI project, DFT, MD, AIMD, data analysis, scientific mapping and software development needs. For addition, please comment on "OfficeNet Consulting + Unit + Demand Keywords".

For characterization, laboratory supplies and instruments, contracts, payments, invoices, shipping, and after-sales support.