Material Characterization

Surfaces, Interfaces, and Wettability

XPS, UPS, AFM, TOF-SIMS, contact angle and interface status analysis.

PROJECTS

Surface interface and wetting project

XPS Survey Spectrum — Reference Image
Surfaces, Interfaces, and Wettability

XPS Survey Spectrum

Survey, core energy level alignment, price analysis; Comprehensive project based on XPS spectral + fine spectrometry; Only Survey is allowed a different price..

High-Resolution XPS — Reference Image
Surfaces, Interfaces, and Wettability

High-Resolution XPS

Survey, core energy level alignment, price analysis

Ultraviolet Photoelectron Spectroscopy (UPS) — Reference Image
Surfaces, Interfaces, and Wettability

Ultraviolet Photoelectron Spectroscopy (UPS)

UPS spectra, Work Function, price band structure

Auger Electron Spectroscopy (AES) — Reference Image
Surfaces, Interfaces, and Wettability

Auger Electron Spectroscopy (AES)

Qualification of surface elements/semi-quantitative, micro-area composition analysis; Depth Parsing Optional

TOF-SIMS Surface Analysis — Reference Image
Surfaces, Interfaces, and Wettability

TOF-SIMS Surface Analysis

Ion fragments, Deep Curve, Two-dimensional imaging

Depth Profiling — Reference Image
Surfaces, Interfaces, and Wettability

Depth Profiling

Deep Parsing Curves, Different Depth Prices; XPS depth profile reference; ToF-SIMS Depth Profiling reference price 3500 Yen/sample.

Atomic Force Microscopy (AFM) — Reference Image
Surfaces, Interfaces, and Wettability

Atomic Force Microscopy (AFM)

AFM, Rq/Ra, cross-section height

SIMS Depth Profiling — Reference Image
Surfaces, Interfaces, and Wettability

SIMS Depth Profiling

Ion fragments, Deep Curve, Two-dimensional imaging

Contact Angle — Reference Image
Surfaces, Interfaces, and Wettability

Contact Angle

Water/oil exposure angles, rolling angles, surface free energy (optional)

Surface Tension — Reference Image
Surfaces, Interfaces, and Wettability

Surface Tension

Surface Tension, interface tension and time change curve

XRR Film Thickness, Density, and Roughness — Reference Image
Surfaces, Interfaces, and Wettability

XRR Film Thickness, Density, and Roughness

Reflexrate Curve, Proposed Parameters

Plasma Cleaning — Reference Image
Surfaces, Interfaces, and Wettability

Plasma Cleaning

Oxygen/air/nitrogen/thylene

Biolayer Interferometry (BLI) — Reference Image
Surfaces, Interfaces, and Wettability

Biolayer Interferometry (BLI)

Combining kinetic tests

Surface Plasmon Resonance (SPR) — Reference Image
Surfaces, Interfaces, and Wettability

Surface Plasmon Resonance (SPR)

Molecular dynamics

Chemisorption: TPD, TPR, and TPO — Reference Image
Surfaces, Interfaces, and Wettability

Chemisorption: TPD, TPR, and TPO

TPD/TPR/TPO curve, peak area, active site explanation