XPS + EPR + Raman + XAFS + TEM/EELS
ADVANCED MATERIALS CHARACTERIZATION
Advanced Materials Characterization & In-situ Analysis
Move beyond “collecting a dataset” to answering a research question. We develop tailored workflows combining advanced microscopy, synchrotron methods, in-situ / operando characterization, 3D imaging, advanced spectroscopy and multimodal analysis.
Aberration-corrected TEMSynchrotronIn-situ / Operando3D CTAdvanced SpectroscopyMultimodal
RESEARCH QUESTION FIRST
Research-question-driven characterization, not an instrument list
We select methods according to the material system, target mechanism, sample state and the evidence chain required for publication.
XPS/UPS + KPFM + XAFS + in-situ spectroscopy
In-situ FTIR + Raman + EPR + XAFS
Micro/Nano-CT + FIB-SEM + 3D reconstruction
ADVANCED MICROSCOPY
Microscopy & Interfacial Structure
Atomic-scale structure, interfaces, defects, elemental distributions and local electronic states.
Aberration-corrected TEM / STEM
HAADF-STEM, atomic-resolution imaging, interface/defect analysis, EDS/EELS and correlated structure–composition–electronic-state evidence.
Quoted by sample and workflowFIB Site-specific Preparation
Cross-sectional and site-specific preparation for interfaces, batteries, films and devices, compatible with TEM/STEM and 3D reconstruction.
Reference: from CNY 2,600/sampleAFM / Nanomechanics
Topography, roughness, adhesion, modulus, force curves, phase and local mechanical mapping for membranes, polymers and soft materials.
Reference: from CNY 550/hourCRYSTAL & PHASE
Crystal Structure & Phase Analysis
Crystal phases, phase transitions, orientation, lattice response and complex phase composition.
Single-crystal XRD
Unit cell, space group, bond lengths/angles and coordination environment.
Reference: from CNY 350/sampleIn-situ / Variable-temperature XRD
Track phase evolution and lattice response during reaction, heating, cooling or operating conditions.
Custom quoteEBSD / Texture Analysis
Grain size, orientation, boundaries, texture and local strain in metals, ceramics and polycrystalline materials.
Reference: from CNY 650/hourSURFACE & ELECTRONIC STRUCTURE
Surface Chemistry & Electronic Structure
Oxidation states, energy levels, work function, local potential, bonding and interfacial electronic behavior.
XPS / UPS / Depth Profiling
Elemental composition, chemical states, valence band, work function and depth-dependent composition.
XPS reference: from CNY 30/elementEPR / ESR
Free radicals, defects, unpaired electrons and reactive species in catalysis, energy storage and defect engineering.
Reference: CNY 230–250/objectKPFM / Surface Potential
Local surface potential, contact potential difference and interfacial electronic mapping.
Custom quoteIN-SITU / OPERANDO
In-situ / Operando Characterization
Track dynamic material and intermediate evolution under reaction, atmosphere, electrochemical, thermal or illumination conditions.
In-situ FTIR / DRIFTS
Adsorbates, functional-group changes and reaction intermediates for catalysis, adsorption and interface reactions.
In-situ Raman
Track bonding, phase, defects and reaction species under electrochemical, thermal or gas environments.
In-situ XPS / Electrochemistry
Resolve oxidation-state and interface evolution under operating conditions.
In-situ projects are quoted after confirming sample form, reaction conditions, atmosphere/electrolyte, temperature, potential window and cell compatibility.
3D NON-DESTRUCTIVE IMAGING
3D Structure & Non-destructive Imaging
Quantify pores, cracks, particles, fibers and internal defects beyond 2D sections.
Industrial CT
Non-destructive imaging of internal defects, assemblies, cracks and density contrast in larger samples.
Reference: from CNY 1,300/sampleMicro-CT / Nano-CT
3D pore and structural analysis for porous media, electrodes, geological, biological and composite materials.
Quoted by resolution and scan conditions3D Reconstruction & Quantification
Porosity, connectivity, particle size, thickness, crack and phase-distribution statistics.
Analysis available separatelySYNCHROTRON & ADVANCED SPECTROSCOPY
Synchrotron & Advanced Spectroscopy
Local coordination, oxidation states, ultrafast dynamics, nuclear environments and vacancy/free-volume information.
Synchrotron XAFS
XANES/EXAFS for oxidation state, coordination number, bond distance and local structure, with fitting and computational interpretation where appropriate.
Reference: from CNY 2,600/elementFemtosecond Transient Absorption
Excited states, charge transfer, recombination and ultrafast carrier dynamics.
Reference: from CNY 3,100/sampleMössbauer / Positron Annihilation
Nuclear environment, oxidation state/magnetism, vacancy-type defects and free-volume analysis.
Reference: from CNY 2,600 / 1,700ROUTINE CAPABILITIES
Routine Characterization Capabilities
Routine measurements establish the baseline evidence; advanced methods target critical mechanistic questions. Final quotations depend on sample state, conditions and analysis requirements.
Morphology / MicroanalysisSEMTEMEBSDEPMAAFM
Composition / StructureXRDXRFICP-OES/MSEATOC
Spectroscopy / ChemistryFTIRRamanUV-Vis/NIRPLNMRGC-MSLC-MSEPR
Physical / ThermalBETTG/DSCZETAParticle SizePPMSHallDMANanoindentation
CUSTOM CHARACTERIZATION WORKFLOW
Multimodal & Custom Characterization
Tell us the material, controls, target mechanism and question to be demonstrated. We work backward from the evidence needed instead of simply stacking instruments.
Defects & Active Sites
XPS / EPR / Raman / XAFS / TEM-EELS
In-situ Catalytic Mechanism
In-situ FTIR / Raman / XRD / XAFS + EPR
Membrane Structure–Performance
AFM / XPS / FTIR / XRD / ZETA / pore structure
Battery Interfaces
In-situ Raman / XRD / XPS + TEM + electrochemistry
MOF / COF Multiscale
XRD / BET / TEM / XPS / Raman / XAFS
3D Quantitative Structure
Micro/Nano-CT + FIB-SEM + 3D reconstruction
